Raytex

Raytex Corporation offers a unique line of advanced systems for specialized wafer inspection and metrology. Raytex, headquartered in Tokyo, Japan, is one of the industry,s foremost providers of advanced systems for specialized wafer inspection and metrology. Founded in 1988 by Jun Takamura, Raytex has sales and service offices worldwide. Raytex,s g... oal is to provide the most intelligent, efficient and cost-effective solutions for specific inspection and metrology needs. Since 1988, Raytex has designed and produced equipment for inspecting wafer edges and backsides as well as measuring wafer nanotopography and reading wafer ID. In 2002, a record number of systems were delivered to customers worldwide. Early, proactive, and in-line detection of wafer defects enables customers to minimize wafer breakage during device manufacturing. The best preventative measure to avoid wafer breakage is careful inspection of incoming wafers and elimination of edge defects during processing. At Raytex, you will find that we offer cost-effective inspection solutions that enhance your end results. Raytex,s systems are used in advanced semiconductor and wafer fabrication facilities worldwide. All systems are supported globally by Raytex,s professional sales, applications and service teams. We welcome your inquires about Raytex products, and we extend an open offer to assist you in any way that we can, now or in the future. Contact us today for the latest product information.Read More