Materials Development

Materials Development Corporation was founded in 1970 by a group of faculty and graduate students from some of the most prestigious universities in Southern California. MDC is responsible for a number of innovations in the semiconductor measurement field: 1970: MDC developed and marketed one of the first commercially available automatic doping prof... ilers. 1974: MDC developed and marketed the first commercially available Mercury Probe for non-destructive wafer measurements. 1977: MDC developed and marketed the first computerized C-V plotter. MDC personnel developed many of the analysis algorithms now in use for computerized MOS C-V measurements. 1985: MDC developed and sold the first dual, integrated hot chuck system for high throughput mobile ionic contamination measurements. 1996: MDC developed the first autoloading hotchuck system to increase throughput of mobile ionic contamination measurements. 1997: MDC released the CSM/Win System software, the first C-V plotting software utilizing the Microsoft Windows operating system. This allows the software to be much more versatile in data gathering and analysis. The Windows environment makes for a more user friendly interface as well as offering greater choices in data output. MDC continues to improve both the hardware and software for C-V measurements and analyses of semiconductor devices. Taking full advantage of the latest C-V measuring instruments and more powerful computers, MDC offers the widest variety of C-V and I-V measurement systems available. MDC has sold over 1,500 C-V plotting instruments worldwide. We are proud of our continuing development and education efforts. We are always adding new and improved measurements to keep pace with the fast moving semiconductor industry.Read More