Leonard Rockett

Leonard Rockett, Ph.D. is the president emeritus of Technology Metrics, LLC, a small business specializing in patent services and in management and engineering consulting services. He is a U.S. patent agent, licensed to practice before the U.S. Patent and Trademark Office in the drafting, filing, and prosecution of patent cases. He is a certified p... rogram management professional and a subject matter expert in microelectronics, semiconductor devices, and radiation hardening techniques. Dr. Rockett has had extensive engineering and management experience in private industry. Prior to Technology Metrics, he was a chief engineer at BAE Systems in Manassas VA and his work contributed to the development of multiple generations of radiation hardened technologies and products. For over eight years, he was the manager of the microelectronics business area within the space electronics line of business at BAE Systems, and he was the program management director at BAE Systems during an award-winning three-year DoD-funded $125M foundry modernization program that upgraded the radiation hardened microelectronics foundry. He earned his Ph.D. degree in electrical engineering from Columbia University in the City of New York. He has authored over 80 published technical reports and journal papers, and he holds 16 U.S. patents plus 16 foreign patents. For 12 years while at BAE Systems, Dr. Rockett was a visiting/adjunct professor of electrical engineering at Howard University in Washington DC. He was a member of a National Academies of Sciences, Engineering, and Medicine committee studying the Space Radiation Effects on Electronic Components: Testing Infrastructure for the US Space Program. He is an ABET program evaluator and periodically conducts reviews of engineering degree programs to assess their continued compliance with ABET accreditation criteria. He is a member of the electrical engineering advisory board at the University of the District of Columbia. He is also a member of the AIPLA, a senior member of the IEEE, and an ...Read More