Kim & Wright

John J. Kim began his career in the field of forensic accounting in 1979 with the accounting firm of Campos & Stratis, CPAs in New Jersey. In 1985 Mr. Kim joined Henein, Critelli & Company, as a manager in their New Jersey office. He then formed Kriegstein & Kim, CPAs with Robert Kriegstein in 1993. In 1998, the firm merged with Daniel Wright to fo... rm Kriegstein, Kim & Wright, P.C. Mr. Kim advises clients in first party and liability insurance claims, involving business interruption, extra expenses, property damage and jewelers and furriers block policies Since 1979, Mr. Kim has been exposed to all facets of insurance claims, ranging from small retail establishments to multi-million dollar corporations. He has also assisted a number of law firms on litigious matters and has testified as an expert in federal, state and local courts. Mr. Kim is a member of the following professional associations: Mr. Kim was educated in Kenya, England and in the United States. He received a Bachelor of Science degree, in accounting from Fairleigh Dickinson University in 1979. He obtained his Certified Public Accounting license in 1982. Daniel Wright has over thirty years of experience in forensic accounting and insurance related matters. He began his career in 1976 as a property insurance adjuster and accountant in Philadelphia. He advises clients in the areas of forensic accounting, economic loss measurement, forensic economics, business valuations and litigation support for both civil and criminal matters. Mr. Wright is admitted as an expert in accountancy and business valuation in many federal, state and local courts. He assisted and testified in several major trials, resulting in verdicts for insurance companies litigating business income and extra contractual claims. Mr. Wright has extensive experience handling large first party insurance claims, including business interruption and extra expense, employee dishonesty, personal property valuation, fidelity and surety, business valuation, personal injury, builders risk, ...Read More