Please Note:
This profile was automatically generated using 5 references found on the Internet. This information has not been verified. Learn more...
This profile was automatically generated using 5 references found on the Internet. This information has not been verified. Learn more...
Web References
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1. www.eeplace.com
www.eeplace.com/eeplace/eventD - [Cached]Published on: 8/28/2003 Last Visited: 9/18/2005
Ji Wei-Dong Senior Application Engineer Agilent Technologies -
2. EE Seminar
www.eeplace.com/agilent/eventD - [Cached]Published on: 7/24/2003 Last Visited: 1/3/2008
Ji Weidong Senior Application Engineer
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Weidong received his degree in "Electronic and Automation" from Harbin Institute of Technology in 1990. He then worked in a research institute for five years, where he was responsible for the development of various electronic products. In 1996, he joined HP/Agilent. Over the years, he has been involved in the measurement of hi-speed digital circuits & signal integrity, optical receivers, semiconductor and the partial-RF & microwave transmission testing. He is now dedicating himself to data communication and is responsible for the measurement of various electronic devices such as routers and Ethernet switchers, in terms of performance and protocol analysis.
Wang Bing graduated from the University of Electronic Science and Technology, ChengDu, in 1993 with a major in Electromagnetic Field and Microwave Technologies. He joined Agilent in 2000 and is currently responsible for the support of component test, MW/RF, optical passive component test etc. -
3. www.eeplace.com
www.eeplace.com/agilent/eventD - [Cached]Published on: 5/22/2003 Last Visited: 1/3/2008
Ji Weidong Senior Application Engineer
...
Weidong received his degree in "Electronic and Automation" from Harbin Institute of Technology in 1990. He then worked in a research institute for five years, where he was responsible for the development of various electronic products. In 1996, he joined HP/Agilent. Over the years, he has been involved in the measurement of hi-speed digital circuits & signal integrity, optical receivers, semiconductor and the partial-RF & microwave transmission testing. He is now dedicating himself to data communication and is responsible for the measurement of various electronic devices such as routers and Ethernet switchers, in terms of performance and protocol analysis.
