Please Note:
This profile was automatically generated using 29 references found on the Internet. This information has not been verified. Learn more...
This profile was automatically generated using 29 references found on the Internet. This information has not been verified. Learn more...
View all 29 references Web References
-
1. www.sec.gov
www.sec.gov/Archives/edgar/dat - [Cached]Published on: 6/25/2008 Last Visited: 6/26/2008
0001254638 SANO KUNIO 400 KATO TERRACE FREMONT CA 94539 0 1 0 0 President of AEHR TEST - JAPAN -
2. www.sec.gov
www.sec.gov/Archives/edgar/dat - [Cached]Published on: 6/28/2007 Last Visited: 8/8/2008
0001254638 SANO KUNIO 400 KATO TERRACE FREMONT CA 94539 0 1 0 0 President of Aehr Test-Japan -
3. Senior Management
www.aehr.com/investors/senior_ - [Cached]Published on: 5/25/2008 Last Visited: 5/25/2008
Kunio Sano President, Aehr Test Systems Japan K.K.
...
KUNIO SANO joined the Company as Vice President, Aehr Test Systems Japan K.K., the Company's subsidiary in Japan, in June 1998 and was elected President, Aehr Test Systems Japan K.K. in January 2001.From 1991 to 1998, he served as Manager of the Development Engineering Department at Tokyo Electron Yamanashi Limited, a leading worldwide semiconductor equipment manufacturer.Mr. Sano received a B.S.E.E. from Sagami Institute of Technology in Kanagawa, Japan.

