Hunglin Chen This is Me

Education

 Web References

1. 1. MICRO: Defect/Yield Analysis and Metrology

   www.micromagazine.com/archive/ - [Cached]

   Published on: 4/27/2006   Last Visited: 4/27/2006

   Xianghui Xu, Hunglin Chen, and YiLin Sun, Semiconductor Manufacturing International Corp. (SMIC); and Hongbo Jiang, Nurit Raccah, Mike Chang, and Siqun Xiao, Applied Materials
   ...
   Hunglin Chen is a section manager in the yield engineering department of SMIC. He received a BS in mechanical engineering from National Taipei University of Technology in Taiwan and an MS in applied mechanics from National Taiwan University. (Chen can be reached at +86 5080 200019027 or hunglin chen@smics.com.)
   
   YiLin Sun is the department manager of the yield engineering department at SMIC in Shanghai. Before joining SMIC in 2001, he worked at TSMC for nine years in the fields of defect reduction, process integration, yield enhancement, and technology transfer. He received a BS in physics from the National Tsing-Hua University in Hsinchu, Taiwan, in 1988. (Sun can be reached at yilin sun@smics.com.)