Please Note:
This profile was automatically generated using 4 references found on the Internet. This information has not been verified. Learn more...
This profile was automatically generated using 4 references found on the Internet. This information has not been verified. Learn more...
Employment History
View...Web References
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1. Centre for Emerging Device Technology - Staff
www.eng.mcmaster.ca/cedt/org/s - [Cached]Published on: 2/19/2008 Last Visited: 2/19/2008
Doug M. Bruce, Research Engineer
B.Sc(Eng) Queen's, Ph.D.(1985) York University. Doug joined McMaster in l985 to work on mid-infrared gas lasers and optical waveguide devices. Currently he is involved with the design, fabrication and characterization of semiconductor optical waveguide devices. He is also involved with the optical measurement of strain in semiconductor materials and the relationship between this and device performance and failure mechanisms. -
2. Centre for Emerging Device Technology - Staff
www.eng.mcmaster.ca/cedt/org/. - [Cached]Published on: 1/31/2008 Last Visited: 1/31/2008
Doug M. Bruce, Research Engineer
B.Sc(Eng) Queen's, Ph.D.(1985) York University. Doug joined McMaster in l985 to work on mid-infrared gas lasers and optical waveguide devices. Currently he is involved with the design, fabrication and characterization of semiconductor optical waveguide devices. He is also involved with the optical measurement of strain in semiconductor materials and the relationship between this and device performance and failure mechanisms. -
3. Staff
www.eng.mcmaster.ca/cemd/staff - [Cached]Published on: 12/17/2005 Last Visited: 12/17/2005
Doug M. Bruce, Research Engineer
B.Sc(Eng) Queen's, Ph.D.(1985) York University. Doug joined McMaster in l985 to work on mid-infrared gas lasers and optical waveguide devices. Currently he is invovled with the design, fabrication and characterization of semiconductor optical waveguide devices. He is also involved with the optical measurement of strain in semiconductor materials and the relationship between this and device performance and failure mechanisms.

