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This profile was last updated on 3/19/10  and contains information from public web pages.

Dr. Ozgur Sahin

Wrong Dr. Ozgur Sahin?


Harvard's Rowland Institute

Board Memberships and Affiliations


  • Ph.D.
    Stanford University
  • B.S.
    Bilkent University
  • M.S.
    Stanford University
9 Total References
Web References
Nanogea, 19 Mar 2010 [cached]
The article "Seeing the Little Picture: Novel Nanocoating Gives Atomic Force Microscope Users a Better Look at Individual Molecules," reports that Professor Ozgur Sahin, a Fellow at Harvard's Rowland Institute, has identified Nanogea's Nanocone-Enabled Atomic Force Microscope TM (NE-AFMTM) approach as a way to help researchers spot diseases in its earliest stages.
It is mentioned that Dr. Sahin's greatest bottleneck in his work has been the ability to handle molecules in such a way that does not produce false positives or negatives. He has used AFM machines to measure intermolecular forces but could not be sure whether what he was measuring came from a single molecule or a group of molecules. He felt that the "ability to handle these individual molecules was limited by [his] surface chemistry. Dr. Sahin now believes that the answer may lie with Nanogea's approach to molecular detection.
"Dr. Sahin is correct in his assessment that our approach increases precision and virtually eliminates the chance of false positives.
"The greatest bottleneck in my work ... [cached]
"The greatest bottleneck in my work is the ability to handle molecules in such a way that does not produce false positives or negatives," says Ozgur Sahin, a junior fellow at Harvard's Rowland Institute. Sahin uses an AFM to measure intermolecular forces and provides that data to other scientists. "We can't be sure whether what we're measuring comes from a single molecule or a group of molecules," he says.
Sahin came across a technology he believes has potential to help researchers work with greater precision, improving the accuracy of nanoscale measurements. The material is a nanoparticle coating called NanoCone that is made by Westlake Village, Calif.-based Nanogea, Inc. NanoCone is used to coat AFM probes and the substrates on which samples are placed with cone-shaped nanoparticles that lift and separate individual molecules so they can more easily and accurately be measured. Sahin discovered Nanogea research papers describing their technology while he was searching the Web for new technologies that might improve the accuracy and efficiency of his AFM.
Biological molecules have a recognition capability, Sahin says, adding, "They know to which molecules they want to bind, but our ability to handle these individual molecules is limited by our surface chemistry.
with Dr. Ozgur Sahin, of the ..., 2 June 2008 [cached]
with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to
Veeco — Research Spotlight, Issue 2, 10 Sept 2008 [cached]
Research Spotlight on Ozgur Sahin Veeco - Research Spotlight, Issue 2 ApplicationsLibraryTrainingCompanyInvestorsNews & EventsCareersContactHome
As director of the nanomechanical sensing lab at Harvard's Rowland Institute [1], Dr. Ozgur Sahin is one of a new generation of innovators using Scanning Probe Microscopes (SPMs) and developing techniques to learn more about the nanoscale properties of materials [2]. Dr. Sahin's research covers topics ranging from polymer composite systems to cell and molecular biology. This diverse sample set provides a rich test bed for him to study harmonic signals that result when a probe taps on a surface during TappingMode SPM. These harmonics contain valuable information about the elastic modulus, adhesion, and other phenomena that occur when a tip interacts with a sample.
With traditional SPM cantilevers, harmonic signals are severely attenuated by the transfer function of the cantilever. While working with novel cantilever designs to amplify a single harmonic at Stanford University, Sahin realized that the torsional motion of the cantilever typically has much higher bandwidth than its flexural motion, and that many harmonics could be observed simultaneously by moving the tip laterally to an off-axis position on the cantilever.
Veeco has collaborated with Sahin to produce cantilever probes that take advantage of this phenomenon and allow the collection of data from over 15 different harmonics simultaneously.
About Ozgur Sahin Dr. Ozgur Sahin received his B.S. from Bilkent University, Turkey, and his M.S. and Ph.D. from Stanford University, CA. In 2004, Sahin won the grand prize at the Collegiate Inventors Competition, organized by the U.S. Patent and Trademark Office and the National Inventors Hall of Fame, for his invention of a new kind of atomic force microscope capable of measuring tip-sample interaction forces. Sahin subsequently became a Rowland Junior Fellow at the Rowland Institute at Harvard in 2005, where he is currently directing the nanomechanical sensing lab, fully funded by the Rowland Institute[1].
The HarmoniX innovation became possible ..., 1 June 2008 [cached]
The HarmoniX innovation became possible through collaboration between Veeco AFM scientists and Dr. Ozgur Sahin.As a graduate student at Stanford under the direction of Professors Olav Solgaard and Calvin Quate, Dr. Sahin won the Grand Prize in the National Collegiate Inventor Competition, organized by the U.S. Patent and Trademark Office and the National Inventors Hall of Fame, for his invention of a new kind of atomic force microscope capable of measuring tip-sample interaction forces.
Dr. Sahin, with various Veeco and other research colleagues, has published several scientific papers on his techniques and has continued to develop the technology with Veeco during his tenure as a research fellow at the Rowland Institute at Harvard.1-4 Veeco has licensed Dr. Sahin's technology and now makes it commercially available to the entire SPM scientific community to enable new techniques and groundbreaking discoveries.
Veeco's product scientists and engineering team collaborated with Dr. Sahin to develop and bring this new patented technique to market, and the positive response from its initial audience has been overwhelming.We are convinced that the quantitative, real-time material mapping performance of HarmoniX will enable our customers' success, significantly augmenting the more than 10,000 existing publications that reference Veeco AFMs.As a further effort toward this end, we are proud to announce the Veeco Labs HarmoniX Innovation Research Grant Program and look forward to the exciting new science that will be produced by Veeco AFM users."
References:1. Sahin, O. Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements (2007), Review of Scientific Instruments 78 (10) periods
2. Sahin, O., Magonov, S., Su, C., Quate, C.F., Solgaard, O. An atomic force microscope tip designed to measure time-varying nanomechanical forces (2007), Nature Nanotechnology 2 (8), pp.
3. Sahin, O., Yaralioglu, G., Grow, R., Zappe, S.F., Atalar, A., Quate, C., Solgaard, O. High-resolution imaging of elastic properties using harmonic cantilevers (2004), Sensors and Actuators, A: Physical, 114 (2-3), pp.
4. Sahin, O., Quate, C.F., Solgaard, O., Atalar, A. Resonant harmonic response in tapping-mode atomic force microscopy (2004), Physical Review B - Condensed Matter and Materials Physics, 69 (16), pp.
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