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2008-02-02T00:00:00.000Z

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Wrong Ondrej Krivanek?

Dr. Ondrej L. Krivanek

President

Ondrej Krivanek , Company

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Ondrej Krivanek , Company

Background Information

Employment History

Arizona State University Art Museum

Adjunct Physics Professor

Arizona State University

Director of Research

Gatan Inc

Affiliations

Founder
Nion Co.

Honorary Member
Microscopy Society of America

Fellow
The Royal Society

Postdoctoral Fellow
University of California at Berkeley

Postdoctoral Fellow
Kyoto University

Postdoctoral Fellow
Bell Labs incorporated

Education

B.Sc.

Leeds University

Ph.D.

Physics

Cambridge University

Ph.D.

Physics

University of Cambridge

Web References (130 Total References)


people

www.nion.com [cached]

Nion Company was established in 1997 by Ondrej Krivanek and Niklas Dellby in Washington State, USA, with the goal of researching, designing, and manufacturing high-end electron-optical instruments and other products.

...
Ondrej KrivanekOndrej Krivanek, Company President.Ondrej is a co-founder of Nion.He has a Ph.D. in Physics from the University of Cambridge in the UK.His efforts in developing instrumentation for electron microscopy have earned him several prizes, such as the Duddell Medal from the British Institute of Physics.For recreation he enjoys hiking, skiing, swimming and bicycling, listening to Terry Gross interviews and spending time with his daughters.


MSA M&M 2011: Full Symposia Descriptions & Program Information

www.microscopy.org [cached]

Mike Isaacson and Ondrej Krivanek

...
Ondrej Krivanek, NION


About MSA | Microscopy Society of America

www.microscopy.org [cached]

Ondrej Krivanek


www.nion.com | About Nion

www.nion.com [cached]

Nion Company was established in 1997 by Ondrej Krivanek and Niklas Dellby in the state of Washington, USA, with the goal of researching, designing, and manufacturing high-end electron-optical instruments and similar products.

...
Ondrej is a co-founder of Nion. Ondrej has worked as the director of Research at Gatan Inc., as professor at Arizona State University and as researcher at the Lawrence Berkeley Laboratory. He has been developing electron-optical instruments since his post-doctorate: serial-detection EELS in the early 1980's, parallel-detection EELS in the mid-1980's, CCD cameras and image analysis software for electron microscopy in the late 1980's, and imaging filters in the early 1990's. Since 1995, he has focused on aberration correction, whole microscope design and managing Nion. He has a Ph.D. in Physics from Cambridge University in the UK.


MSA M&M 2011: In-Week Intensive Workshops

new.microscopy.org [cached]

His method to measure aberrations developed with Drs. N. Dellby and O.L. Krivanek of Nion Co. is widely used in STEM aberration correctors. He was one of the first workers to obtain direct sub-Ångström high-angle annular dark-field (HA-ADF) images on an aberration-corrected STEM, and is now part of the DOE TEAM project to develop the next generation of aberration corrector.

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