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Wrong Ondrej Krivanek?

Dr. Ondrej L. Krivanek


Ondrej Krivanek , Company

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Ondrej Krivanek , Company

Background Information

Employment History


Lawrence Berkeley National Laboratory


Arizona State University Art Museum

Director of Research

Gatan Inc


Honorary Member
Microscopy Society of America

The Royal Society

Postdoctoral Fellow
University of California at Berkeley

Postdoctoral Fellow
Kyoto University

Postdoctoral Fellow
Bell Labs incorporated

Nion Co.



Leeds University



Cambridge University

Web References (60 Total References)

people [cached]

Nion Company was established in 1997 by Ondrej Krivanek and Niklas Dellby in Washington State, USA, with the goal of researching, designing, and manufacturing high-end electron-optical instruments and other products.

Ondrej KrivanekOndrej Krivanek, Company President.Ondrej is a co-founder of Nion.He has a Ph.D. in Physics from the University of Cambridge in the UK.His efforts in developing instrumentation for electron microscopy have earned him several prizes, such as the Duddell Medal from the British Institute of Physics.For recreation he enjoys hiking, skiing, swimming and bicycling, listening to Terry Gross interviews and spending time with his daughters. | About Nion [cached]

Nion Company was established in 1997 by Ondrej Krivanek and Niklas Dellby in the state of Washington, USA, with the goal of researching, designing, and manufacturing high-end electron-optical instruments and similar products.

Ondrej is a co-founder of Nion. Ondrej has worked as the director of Research at Gatan Inc., as professor at Arizona State University and as researcher at the Lawrence Berkeley Laboratory. He has been developing electron-optical instruments since his post-doctorate: serial-detection EELS in the early 1980's, parallel-detection EELS in the mid-1980's, CCD cameras and image analysis software for electron microscopy in the late 1980's, and imaging filters in the early 1990's. Since 1995, he has focused on aberration correction, whole microscope design and managing Nion. He has a Ph.D. in Physics from Cambridge University in the UK.

MSA M&M 2011: In-Week Intensive Workshops [cached]

His method to measure aberrations developed with Drs. N. Dellby and O.L. Krivanek of Nion Co. is widely used in STEM aberration correctors. He was one of the first workers to obtain direct sub-Ångström high-angle annular dark-field (HA-ADF) images on an aberration-corrected STEM, and is now part of the DOE TEAM project to develop the next generation of aberration corrector.

MSA M&M 2011: Full Symposia Descriptions & Program Information [cached]

Mike Isaacson and Ondrej Krivanek

Ondrej Krivanek, NION

About MSA | Microscopy Society of America [cached]

Ondrej Krivanek

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